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发明名称
Verfahren zum Messen von Oberflaechentemperaturen mittels Strahlungsmesser
摘要
申请公布号
DE906021(C)
申请公布日期
1954.03.08
申请号
DE1948P009132
申请日期
1948.10.02
申请人
SIEMENS & HALSKE AKTIENGESELLSCHAFT
发明人
GRUESS DR. PHIL. HEINZ
分类号
G01J5/24
主分类号
G01J5/24
代理机构
代理人
主权项
地址
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