发明名称 MANUFACTURING METHOD OF PHOTOMASK, PELLICLE FRAME AND SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To suppress intrusion and generation of foreign matter in a closed space formed by a mask, a pellicle frame and a pellicle film in a photomask. <P>SOLUTION: The photomask has a mask 1, a pellicle frame 2 which is arranged on the mask 1 and has a predetermined height, and a pellicle film 3 provided on the pellicle frame 2 facing the mask 1. The pellicle film 3 forms the closed space with the mask 1 and the pellicle frame 2. The pellicle frame 2 has a vent hole which connects the inside and outside of the closed space, with irregularities on the inner wall of the vent hole. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012037800(A) 申请公布日期 2012.02.23
申请号 JP20100179343 申请日期 2010.08.10
申请人 RENESAS ELECTRONICS CORP 发明人
分类号 G03F1/64 主分类号 G03F1/64
代理机构 代理人
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