发明名称 |
METHOD OF MANUFACTURING REFLECTIVE MASK BLANK HAVING PSEUDO PHASE DEFECT, AND METHOD OF MANUFACTURING REFLECTIVE MASK HAVING PSEUDO PHASE DEFECT |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method of manufacturing a reflective mask blank having a pseudo phase defect and a method of manufacturing a reflective mask having a pseudo phase defect capable of forming several kinds of concave design defects with different depths and several kinds of convex design defects with different heights on the same substrate, without a complex process of performing a pattern formation and etching process a plurality of times depending on the number of kinds of depths or heights of the design defects. <P>SOLUTION: All patterns of several kinds of concave design defects with different depths and several kinds of convex design defects with different heights are collectively formed on a hard mask formed on a substrate using a positive resist process and a negative resist process once alternately. Thereafter, the substrate is sequentially etched while masking the hard mask pattern. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012038786(A) |
申请公布日期 |
2012.02.23 |
申请号 |
JP20100174917 |
申请日期 |
2010.08.03 |
申请人 |
DAINIPPON PRINTING CO LTD |
发明人 |
ABE TSUKASA;TAKIGAWA TADAHIKO;ISHIKAWA MIKIO |
分类号 |
H01L21/027;G03F1/84 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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