发明名称 |
III-V COMPOUND SEMICONDUCTOR MATERIAL WITH NO ANTI-PHASE BOUNDARY ON SEMICONDUCTOR SUBSTRATE AND MANUFACTURING METHOD OF THE SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a III-V compound semiconductor material with no anti-phase boundary (APB) and the manufacturing method of the same. <P>SOLUTION: A manufacturing method of a III-V compound semiconductor material comprises: a) a process for preparing a substrate made of a first semiconductor material having a (001) orientation, an insulation layer positioned on the substrate to contact the substrate, and a concavity region to expose at least a part of the substrate in the insulation layer; b) a process for forming a buffer layer positioned on the exposed substrate in the concavity region to contact the exposed substrate; c) a process for applying heat treatment to roughen the surface of the buffer layer. The buffer layer has a round shape having a double-step surface after the application of heat treatment. The manufacturing method further comprises d) a process for at least partly filling the concavity region by the III-V compound semiconductor material positioned on the double-step surface of the buffer layer to contact the buffer layer. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012039115(A) |
申请公布日期 |
2012.02.23 |
申请号 |
JP20110171715 |
申请日期 |
2011.08.05 |
申请人 |
IMEC;KATHOLIEKE UNIV LEUVEN KU LEUVEN R&D |
发明人 |
WANG GAN;MATTI KAIMAX;MARTIN LEWIS;WEI YI WANG;NIAM WALDRON |
分类号 |
H01L21/20;C23C16/30;C23C16/56;H01L21/205 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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