发明名称 |
SEMICONDUCTOR DEVICE, ELECTRONIC DEVICE, QUALITY INFORMATION PROVIDING SYSTEM, AND PROGRAM |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a technique for efficiently obtaining quality information of a semiconductor device. <P>SOLUTION: A semiconductor device 10 comprises: an identification information storage part for holding identification information for discriminating the device from other semiconductor devices; a first storage part for storing first information for acquiring quality information from a server 30 which holds the quality information of the semiconductor device; and a communication part for communicating with an electronic device 20 and transmitting information stored in the semiconductor device 10 to the electronic device 20. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012038005(A) |
申请公布日期 |
2012.02.23 |
申请号 |
JP20100176081 |
申请日期 |
2010.08.05 |
申请人 |
RENESAS ELECTRONICS CORP |
发明人 |
FUKUNAGA MITSUHIRO;IDE SHIGEAKI |
分类号 |
G06Q50/04;G05B19/418;G06Q50/10;H01L21/02 |
主分类号 |
G06Q50/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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