发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR THIN FILM, SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR THIN FILM MANUFACTURING APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a manufacturing method of a semiconductor thin film, a semiconductor device, and a semiconductor thin film manufacturing apparatus, by which a semiconductor thin film including linear crystal grains with a length of more than 10 &mu;m, whose two axes of crystal orientations are substantially aligned, can be formed, and a semiconductor device with high mobility and uniform characteristics can be provided. <P>SOLUTION: Through continuous-wave laser crystallization with a diffraction type laser beam homogenizer, a laser spot is made linear or rectangular, thereby forming laser intensity distribution that is substantially homogeneous in a length direction. Two or more of the laser spots are aligned at appropriate intervals in a direction where the laser spot is short. The multiple laser spots are delivered on a silicon thin film and scanned in the direction where the laser spot is short, thereby performing lateral-direction crystallization of the silicon thin film. Thus, a polycrystalline silicon thin film including crystal grains whose two axes of crystal orientations are substantially aligned can be formed. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012038843(A) 申请公布日期 2012.02.23
申请号 JP20100176075 申请日期 2010.08.05
申请人 TOHOKU UNIV 发明人
分类号 H01L21/20;H01L21/268;H01L21/336;H01L29/786 主分类号 H01L21/20
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