发明名称 METHOD OF PROCESSING OF NITRIDE SEMICONDUCTOR WAFER, NITRIDE SEMICONDUCTOR WAFER, METHOD OF PRODUCING NITRIDE SEMICONDUCTOR DEVICE AND NITRIDE SEMICONDUCTOR DEVICE
摘要 A nitride semiconductor wafer is planar-processed by grinding a bottom surface of the wafer, etching the bottom surface by, e.g., KOH for removing a bottom process-induced degradation layer, chamfering by a rubber whetstone bonded with 100 wt %-60 wt % #3000-#600 diamond granules and 0 wt %-40 wt % oxide granules, grinding and polishing a top surface of the wafer, etching the top surface for eliminating a top process-induced degradation layer and maintaining a 0.5μm-10μm thick edge process-induced degradation layer.
申请公布号 US2012043645(A1) 申请公布日期 2012.02.23
申请号 US201113287670 申请日期 2011.11.02
申请人 ISHIBASHI KEIJI;MIKAMI HIDENORI;MATSUMOTO NAOKI;SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 ISHIBASHI KEIJI;MIKAMI HIDENORI;MATSUMOTO NAOKI
分类号 H01L29/20;B24B9/00;B24D3/00;B24D3/22;B24D3/32;H01L21/304;H01L21/306;H01L21/3065;H01L33/32 主分类号 H01L29/20
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