| 摘要 |
<p>A refractive index measurement device (1) comprises a light source (10), a measurement cell (12, 22) that includes a sample (125, 226) the refractive index of which is to be measured, and diffracts light incident from the light source, a detector (13) that detects the amount of light in at least one diffraction order including a diffraction order other than a zero order of diffracted light emitted from the measurement cell, and a controller (15) that finds the refractive index of the sample corresponding to the measured value of the amount of the diffracted light in at least one diffraction order detected by the detector. The measurement cell comprises a first substrate (121, 221) and a second substrate (121, 221) that are disposed so as to face each other, and a diffraction grating (123, 225) disposed between the first and second substrates, the diffraction grating comprises a plurality of members the width of each of which in the direction parallel to the first substrate surface decreases in a stepwise shape from the first substrate toward the second substrate, and the sample (125, 226) the refractive index of which is to be measured is filled into a space in which the diffraction grating is not formed within a space between the first and second substrates.</p> |
