发明名称 DRY ETCHING METHOD AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p>A dry etching method comprises: a first etching step of introducing a fluorine-containing etching gas into a vacuum chamber (10), making the etching gas into plasma with an antenna (41) and forming a depression (55) on a substrate (Sb); and a second etching step of supplying a deposition gas into the vacuum chamber (10) while continuously reducing the etching gas present within the vacuum chamber (10), and forming a protective film (57) on at least an inside surface of the depression (55) with the deposition gas, which has been made into plasma, while proceeding with the etching of the depression (55) with the etching gas, which has been made into plasma.</p>
申请公布号 WO2012023537(A1) 申请公布日期 2012.02.23
申请号 WO2011JP68517 申请日期 2011.08.15
申请人 ULVAC, INC.;MORIKAWA, YASUHIRO 发明人 MORIKAWA, YASUHIRO
分类号 H01L21/3065 主分类号 H01L21/3065
代理机构 代理人
主权项
地址