发明名称 TEMPERATURE PREDICTION SYSTEM FOR ELECTRONIC DEVICE AND TEMPERATURE PREDICTION METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a temperature prediction system that allows recognition of a heat problem in an existing electronic device before starting operation of an added electronic device and to provide a temperature prediction method. <P>SOLUTION: The temperature prediction system for electronic device predicts temperature of an electronic device 1-1 when an electronic device 1-2 is loaded in addition to the electronic device 1-1 in a rack 9. The temperature prediction system comprises a calculation part 3 and a detection part 2 for detecting temperature of the electronic device 1-1. The calculation part 3 calculates a first temperature of the electronic device 1-1 before starting operation, a second temperature of the electronic device 1-1 during operation, and a third temperature of the electronic device 1-1 before operation with the electronic device 1-2 additionally loaded in the rack 9. Further, the calculation part 3 calculates a fourth temperature of the electronic device 1-1 during operation with the electronic device 1-1 and the electronic device 1-2 loaded in the rack 9 based on the first to the third temperatures. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012038250(A) 申请公布日期 2012.02.23
申请号 JP20100180345 申请日期 2010.08.11
申请人 NEC CORP 发明人
分类号 G06F1/20 主分类号 G06F1/20
代理机构 代理人
主权项
地址