| 摘要 |
<P>PROBLEM TO BE SOLVED: To reliably perform screening of a nonvolatile semiconductor memory without affecting productivity in manufacturing process. <P>SOLUTION: In the manufacturing process of a nonvolatile semiconductor memory, a screening method comprises: a first step for writing data to one or more floating gates after the nonvolatile semiconductor memory is determined to be non-defective as a result of an inspection; and a second step for determining the nonvolatile semiconductor memory to be non-defective if the written data can be read from all the floating gates, in which the data is written in the first step, during a non-defective check process after manufacturing is completed. <P>COPYRIGHT: (C)2012,JPO&INPIT |
