发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a nonvolatile semiconductor memory device and a method of manufacturing the same, which can increase the yield. <P>SOLUTION: The nonvolatile semiconductor memory device according to an embodiment comprises: a laminate having interelectrode insulating films and electrode films alternately stacked in a first direction; semiconductor pillars piercing the laminate in the first direction; a memory layer provided between each electrode film and each semiconductor pillar and extending in the first direction; a first insulating film provided between the memory layer and the semiconductor pillar and extending in the first direction; and a second insulating film provided between each electrode film and the memory layer and extending in the first direction. The second insulating film protrudes between the electrode films. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012038865(A) 申请公布日期 2012.02.23
申请号 JP20100176667 申请日期 2010.08.05
申请人 TOSHIBA CORP 发明人
分类号 H01L27/115;H01L21/8247;H01L29/788;H01L29/792 主分类号 H01L27/115
代理机构 代理人
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