| 摘要 |
An inspection apparatus includes: an insertion portion which is inserted into a device under inspection; a projection unit which projects a striped pattern including a plurality of linear patterns onto an object; an imaging unit which is provided in the insertion portion and images the object onto which the striped pattern is projected and generates image data; a specification unit which specifies an area of interest of the object in an image based on a position of the striped pattern in the image based on the image data; and a measurement unit which measures the area of the object using the image data. |
