PROBE PIN FOR SEMICONDUCTOR TESTING EQUIPMENT

摘要

PURPOSE: A probe pin for semiconductor inspection equipment is provided to form a plating layer of a hollow inner wall into stable and uniform state. CONSTITUTION: A hollow(21) is formed in inside of a body(20) and a plurality of control projections(22) is formed in an entrance of the hollow to an inner direction. A terminal pin(30) forms a pin rod(31) which is drawn in and out in the inner side of the hollow. The terminal pin forms a distance restraint groove(32) and restricts a distance which is drawn in and out in the hollow by a control projection. Both ends of a spring(40) are supported by the terminal pin and the body and give elasticity to drawing in and out drive of the pin rod.