发明名称 Method and system for standardizing microscope instruments
摘要 Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.
申请公布号 US8120768(B2) 申请公布日期 2012.02.21
申请号 US201113010643 申请日期 2011.01.20
申请人 CHRISTIANSEN JASON;PINARD ROBERT;ZERKOWSKI MACIEJ P.;TEDESCHI GREGORY R.;HISTORX, INC. 发明人 CHRISTIANSEN JASON;PINARD ROBERT;ZERKOWSKI MACIEJ P.;TEDESCHI GREGORY R.
分类号 G01J1/00 主分类号 G01J1/00
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