发明名称 |
Method and system for standardizing microscope instruments |
摘要 |
Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.
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申请公布号 |
US8120768(B2) |
申请公布日期 |
2012.02.21 |
申请号 |
US201113010643 |
申请日期 |
2011.01.20 |
申请人 |
CHRISTIANSEN JASON;PINARD ROBERT;ZERKOWSKI MACIEJ P.;TEDESCHI GREGORY R.;HISTORX, INC. |
发明人 |
CHRISTIANSEN JASON;PINARD ROBERT;ZERKOWSKI MACIEJ P.;TEDESCHI GREGORY R. |
分类号 |
G01J1/00 |
主分类号 |
G01J1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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