发明名称 |
ELEMENT ISOLATION STRUCTURE OF SEMICONDUCTOR AND METHOD FOR FORMING THE SAME |
摘要 |
PURPOSE: A device isolation structure of a semiconductor device and a forming method thereof are provided to prevent poly stringer by forming a deep trench inside a shallow trench. CONSTITUTION: A semiconductor substrate(101) includes an inactive region and an active region. A deep trench(121) is formed in the inactive region of the semiconductor substrate. A shallow trench(131) is overlapped with the deep trench. An oxide film(133) and a first device isolation pattern are formed in the deep trench. A second device isolation pattern is contacted with the first device isolation pattern. |
申请公布号 |
KR20120015368(A) |
申请公布日期 |
2012.02.21 |
申请号 |
KR20100070198 |
申请日期 |
2010.07.20 |
申请人 |
MAGNACHIP SEMICONDUCTOR, LTD. |
发明人 |
KANG, YANG BEOM |
分类号 |
H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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