发明名称 ELEMENT ISOLATION STRUCTURE OF SEMICONDUCTOR AND METHOD FOR FORMING THE SAME
摘要 PURPOSE: A device isolation structure of a semiconductor device and a forming method thereof are provided to prevent poly stringer by forming a deep trench inside a shallow trench. CONSTITUTION: A semiconductor substrate(101) includes an inactive region and an active region. A deep trench(121) is formed in the inactive region of the semiconductor substrate. A shallow trench(131) is overlapped with the deep trench. An oxide film(133) and a first device isolation pattern are formed in the deep trench. A second device isolation pattern is contacted with the first device isolation pattern.
申请公布号 KR20120015368(A) 申请公布日期 2012.02.21
申请号 KR20100070198 申请日期 2010.07.20
申请人 MAGNACHIP SEMICONDUCTOR, LTD. 发明人 KANG, YANG BEOM
分类号 H01L21/76 主分类号 H01L21/76
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