发明名称 Method of forming a metal layer and a method of fabricating a semiconductor device
摘要 A method of forming metal films includes preparing a substrate, on which an insulating layer and a metal layer formed of a first metal are exposed; and forming a metal capping layer by supplying an organic precursor of a second metal onto the substrate to deposit the second metal simultaneously on the insulating layer and the metal layer, wherein the second metal capping layer has different thicknesses on the insulating layer and the metal layer.
申请公布号 US8119526(B2) 申请公布日期 2012.02.21
申请号 US20100955093 申请日期 2010.11.29
申请人 JUNG EUN-JI;SOHN WOONG-HEE;KIM SU-KYOUNG;CHOI GIL-HEYUN;KIM BYUNG-HEE;SAMSUNG ELECTRONICS CO., LTD. 发明人 JUNG EUN-JI;SOHN WOONG-HEE;KIM SU-KYOUNG;CHOI GIL-HEYUN;KIM BYUNG-HEE
分类号 H01L21/44 主分类号 H01L21/44
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