发明名称 Semiconductor device including ruthenium electrode and method for fabricating the same
摘要 A semiconductor device includes a semiconductor substrate, an insulation pattern on the semiconductor substrate, and an etch stop layer on the insulating pattern, the insulation pattern and the etch stop layer defining a contact hole that exposes the substrate, a first plug filled in a portion of the contact hole, a diffusion barrier layer formed above the first plug and in a bottom portion and on sidewalls of a remaining portion of the contact hole, a second plug fainted on the diffusion barrier layer and filled in the contact hole, and a storage node coupled to and formed on the second plug.
申请公布号 US8120180(B2) 申请公布日期 2012.02.21
申请号 US20100837947 申请日期 2010.07.16
申请人 KIM JIN-HYOCK;ROH JAE-SUNG;YEOM SEUNG-JIN;LEE KEE-JEUNG;SONG HAN-SANG;KIL DEOK-SIN;KIM YOUNG-DAE;HYNIX SEMICONDUCTOR INC. 发明人 KIM JIN-HYOCK;ROH JAE-SUNG;YEOM SEUNG-JIN;LEE KEE-JEUNG;SONG HAN-SANG;KIL DEOK-SIN;KIM YOUNG-DAE
分类号 H01L21/00 主分类号 H01L21/00
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