发明名称 Quantum efficiency measurement apparatus and quantum efficiency measurement method
摘要 A sample that is an object whose quantum efficiency is to be measured, and a standard object having a known reflectance characteristic are each attached to a sample window provided in a plane mirror. Based on respective spectrums measured by a spectrometer in respective cases where the sample is attached and the standard object is attached, the quantum efficiency of the sample is measured. The plane of an opening of an observation window is made substantially coincident with the exposed surface of the sample or standard object, so that direct incidence, on the observation window, of the fluorescence generated from the sample receiving an excitation light and the excitation light reflected from sample is prevented.
申请公布号 US8119996(B2) 申请公布日期 2012.02.21
申请号 US20090520975 申请日期 2009.01.20
申请人 OHKUBO KAZUAKI;OTSUKA ELECTRONICS CO., LTD. 发明人 OHKUBO KAZUAKI
分类号 G01J1/04 主分类号 G01J1/04
代理机构 代理人
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