发明名称 |
Method for generating test files from scanned test vector pattern drawings |
摘要 |
A graphical bitmap image of a scanned test pattern drawing is transformed into a test file in a file format that is readily usable to provide stimuli for computer-aided design (CAD) tools or integrated circuit (IC) testing equipment. A bitmap image of each page of the test pattern drawing is produced as a graphical image of the rows and columns of test pattern data. Non-essential drawing symbols are then removed from the bitmap image, such as the lines used to draw the table. Essential test pattern information is recognized and is converted into a machine readable format by first storing the data in a tabular format having rows and columns which correspond to the rows and columns of the test pattern drawing. The stored test pattern data is then integrated with a machine readable file format which is adaptable to the CAD and IC tool in order to produce the machine readable test file.
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申请公布号 |
US6332032(B1) |
申请公布日期 |
2001.12.18 |
申请号 |
US19980210529 |
申请日期 |
1998.12.03 |
申请人 |
THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE ARMY |
发明人 |
MICHAEL GERALD T.;SU WEI;DUKES MICHAEL A. |
分类号 |
G01R31/3183;G06T7/00;(IPC1-7):G06K9/62 |
主分类号 |
G01R31/3183 |
代理机构 |
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