| 摘要 |
<P>PROBLEM TO BE SOLVED: To protect a tested device and a testing device. <P>SOLUTION: The testing device for testing a device to be tested includes: an inductive load part having an inductive component, which is formed in a path for supplying test current to the tested device; a switching part for switching whether to supply the test current from the inductive load part to the tested device; and a cut-off control unit for cutting off the path by switching the switching part according to the state of the tested device; and a voltage control unit for controlling the voltage of the path between the inductive load part and the switching part to a predetermined clamp voltage or lower. <P>COPYRIGHT: (C)2012,JPO&INPIT |
