发明名称 METHOD OF MANUFACTURING TRENCH TYPE METAL OXIDE FILM SEMICONDUCTOR FIELD EFFECT TRANSISTOR
摘要 <P>PROBLEM TO BE SOLVED: To provide a method capable of manufacturing a trench type metal oxide film semiconductor field effect transistor (MOSFET) upward. <P>SOLUTION: A trench bottom doping (TBD) process and/or a trench bottom oxide (TBO) process may be performed after forming a substrate and a first epitaxial (epi) layer. In order to improve the quality and purity of a second epi layer which is formed in a merged epitaxial lateral overgrowth (MELO) step, sealing by poly may be performed after formation of the TBO layer and before the MELO step. Plasma dry etching using an endpoint mode may be performed according to the position of the TBO layer in order to improve uniformity in the depth of the trench. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012033937(A) 申请公布日期 2012.02.16
申请号 JP20110168241 申请日期 2011.08.01
申请人 O2 MICRO INC 发明人 LU HAMILTON;LIPCSEI LASZLO
分类号 H01L21/336;H01L21/20;H01L29/78 主分类号 H01L21/336
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