| 摘要 |
PROBLEM TO BE SOLVED: To set a range for judging whether electronic devices are good or not, in accordance with test patterns to be supplied to the electronic devices. SOLUTION: A testing apparatus 10 includes a pattern supply part 12 for supplying the test pattern to the electronic device 40, power sources 14a and 14b for impressing supply voltages to the electronic device 40 and a reference electronic device 42 respectively, a measuring part 16 for the device to be tested which measures a current value to be tested as a value of a current flowing to the electronic device 40 when the test pattern is supplied, an expectation output part 18 for outputting an expectation of the current which is to flow to the electronic device 40 when the test pattern is supplied, a differential calculating part 24 for calculating a difference between the current value to be tested which is measured by the measuring part 16 and the expectation, a judging part 30 for judging on the basis of the calculation result by the differential calculating part 24 whether or not the electronic device 40 is good, and a judgment result storage part 34 for storing the test result judged by the judging part 30.
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