发明名称 SAMPLING DIGITIZER AND SEMICONDUCTOR INTEGRATED CIRCUIT TESTING DEVICE PROVIDED WITH THE SAMPLING DIGITIZER
摘要 PROBLEM TO BE SOLVED: To provide a sampling digitizer, capable of freely changing a sampling rate of data to be read into a digitizer, without changing the sampling rate in a sampling head. SOLUTION: In this sampling digitizer composed of the sampling head 11, a clock-generating part 12 and the digitizer 13, a thinning circuit 22 limiting the number of passing clock signals is inserted in a supply path of clock signals ranging from the clock generating part to the digitizer. The number of thinning of the thinning circuit is set at a desired value, and a low-speed data signal output from the sampling head is fetched into the digitizer at a desired sampling rate.
申请公布号 JP2002156389(A) 申请公布日期 2002.05.31
申请号 JP20000349217 申请日期 2000.11.16
申请人 ADVANTEST CORP 发明人 NAKAJIMA TAKAHIRO
分类号 G01R13/34;G01R31/28;(IPC1-7):G01R13/34 主分类号 G01R13/34
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