发明名称 METHOD AND APPARATUS FOR ONE-SIDE CHEMICAL MECHANICAL POLISHING SILICON WAFERS
摘要 <p>Disclosed is a method for one-side chemical mechanical polishing silicon wafers. A rinsing polishing stage is operated after a primary polishing stage and/or a finishing polishing stage. An apparatus for one-side chemical mechanical polishing silicon wafers includes a primary polishing table (17) and/or a finishing polishing table (10) and a cleaning table (8). The method and apparatus of the present invention can effectively reduce or eliminate residual of polishing liquid on surface of silicon wafers, thus greatly improving the one-side polishing quality of silicon wafers, and can satisfy the flatness and microscopic roughness for silicon wafers having a big diameter of no less than 300 mm.</p>
申请公布号 WO2012019333(A1) 申请公布日期 2012.02.16
申请号 WO2010CN01803 申请日期 2010.11.10
申请人 THE 45TH RESEARCH INSTITUTE OF CETC;LIU, BIN;LI, WEI;GUO, QIANGSHENG;LIAO, CHUIXIN 发明人 LIU, BIN;LI, WEI;GUO, QIANGSHENG;LIAO, CHUIXIN
分类号 B24B37/04 主分类号 B24B37/04
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