| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a probe in which a desired contact area with a terminal can be obtained, a tool with the same, and a testing apparatus with the same. <P>SOLUTION: A probe 1 is abutted to a surface 10a of a terminal 10 used for an inspection, and includes a holding member 2 having conductivity, and a conductive and deformable distal end part 3 held in a distal end of the holding member 2. The distal end part 3 includes a spatial area 4 in which a projecting portion 11 on the surface 10a of the terminal 10 can be received when the distal end part 3 is abutted to the surface 10a of the terminal 10, and a contact portion 5 which is positioned between the spatial area 4 and the terminal 10 and abutted to the surface 10a of the terminal 10. <P>COPYRIGHT: (C)2012,JPO&INPIT |
