发明名称 |
ALUMINUM NITRIDE SUBSTRATE, ALUMINUM NITRIDE CIRCUIT BOARD, SEMICONDUCTOR APPARATUS, AND METHOD FOR MANUFACTURING ALUMINUM NITRIDE SUBSTRATE |
摘要 |
The present invention provides an aluminum nitride substrate and an aluminum nitride circuit board having excellent insulation characteristics and heat dissipation properties and having high strength, a semiconductor apparatus, and a method for manufacturing an aluminum nitride substrate. An aluminum nitride substrate according to the present invention is an aluminum nitride substrate having aluminum nitride as a main component and comprising a polycrystal containing a plurality of aluminum nitride grains, and complex oxide grains being present at grain boundaries of the aluminum nitride grains and including a rare earth element and aluminum, wherein the aluminum nitride grains have a maximum grain size of 10μm or less, the complex oxide grains have a maximum grain size smaller than the maximum grain size of the aluminum nitride grains, the number of the complex oxide grains having a grain size of 1μm or more being present in a field of view of 100μm×100μm of a surface of the aluminum nitride substrate observed is 40 or more, the aluminum nitride substrate has a bending strength of 400 MPa or more in an unpolished state after firing, and the aluminum nitride substrate has a volume resistivity of 1012Ωm or more.
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申请公布号 |
US2012038038(A1) |
申请公布日期 |
2012.02.16 |
申请号 |
US201013259222 |
申请日期 |
2010.02.05 |
申请人 |
YAMAGUCHI HARUHIKO;FUKUDA YOSHIYUKI;TOSHIBA MATERIALS CO., LTD.;KABUSHIKI KAISHA TOSHIBA |
发明人 |
YAMAGUCHI HARUHIKO;FUKUDA YOSHIYUKI |
分类号 |
H01L23/15;C04B35/50;C04B35/64;H05K1/05 |
主分类号 |
H01L23/15 |
代理机构 |
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