发明名称 Measurement System Using Alignment Unit And Position Measuring Method
摘要 In one example embodiment, position of the alignment unit is acquired using a fiducial mark formed on a moving table, and the moving table is moved such that an alignment mark formed on the workpiece is located within a field of view of the alignment unit to measure the position of the alignment mark. Subsequently, the position and posture of the workpiece are accurately measured based on the position of the alignment unit and the position of the alignment mark measured by the alignment unit.
申请公布号 US2012038936(A1) 申请公布日期 2012.02.16
申请号 US201113185047 申请日期 2011.07.18
申请人 AHN SUNG MIN;JANG SANG DON;SON TAE KYU;SAMSUNG ELECTRONICS CO., LTD. 发明人 AHN SUNG MIN;JANG SANG DON;SON TAE KYU
分类号 G01B11/14 主分类号 G01B11/14
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