发明名称 PROCESS MODEL BASE AUTOMATIC TEST SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To provide a machine capable of increasing the efficiency of test for building a process control system. <P>SOLUTION: The system includes a device model registration section 250 that creates a model of a processing device constituting a process control system using software and registers the device model created by the software; and a process control sequence registration section 240 that registers the process control sequence. A test is carried out by virtually activating the device model associating it with a corresponding process control sequence. Operation signals from the device model are accumulated in order in a test result DB300 and the accumulated data are displayed on a register-test terminal 60 by associating it with the process control sequence; thus the process model base test is achieved. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012032899(A) 申请公布日期 2012.02.16
申请号 JP20100170009 申请日期 2010.07.29
申请人 HITACHI HIGH-TECH CONTROL SYSTEMS CORP 发明人 HAGIWARA CHIKARA;TAZAKI SHUNJI
分类号 G05B23/02 主分类号 G05B23/02
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