发明名称 |
PROCESS MODEL BASE AUTOMATIC TEST SYSTEM |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a machine capable of increasing the efficiency of test for building a process control system. <P>SOLUTION: The system includes a device model registration section 250 that creates a model of a processing device constituting a process control system using software and registers the device model created by the software; and a process control sequence registration section 240 that registers the process control sequence. A test is carried out by virtually activating the device model associating it with a corresponding process control sequence. Operation signals from the device model are accumulated in order in a test result DB300 and the accumulated data are displayed on a register-test terminal 60 by associating it with the process control sequence; thus the process model base test is achieved. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012032899(A) |
申请公布日期 |
2012.02.16 |
申请号 |
JP20100170009 |
申请日期 |
2010.07.29 |
申请人 |
HITACHI HIGH-TECH CONTROL SYSTEMS CORP |
发明人 |
HAGIWARA CHIKARA;TAZAKI SHUNJI |
分类号 |
G05B23/02 |
主分类号 |
G05B23/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|