发明名称 SEMICONDUCTOR DEVICE AND FABRICATING METHOD THEREOF
摘要 A fabricating method of a semiconductor device is provided. Pillars are formed on a substrate. A first oxide layer is continuously formed on upper surfaces and side walls of the pillars by non-conformal liner atomic layer deposition. The first oxide layer continuously covers the pillars and has at least one first opening. The first oxide layer is partially removed to expose the upper surfaces of the pillars, and a first supporting element is formed on the side wall of each of the pillars. The first supporting element is located at a first height on the side wall of the corresponding pillar and surrounds the periphery of the corresponding pillar. The first supporting elements around two adjacent pillars are connected and the first supporting elements around two opposite pillars do not mutually come into contact and have a second opening therebetween.
申请公布号 US2012038052(A1) 申请公布日期 2012.02.16
申请号 US20100853313 申请日期 2010.08.10
申请人 WANG CHARLES C.;NANYA TECHNOLOGY CORPORATION 发明人 WANG CHARLES C.
分类号 H01L23/48;H01L21/768;H01L23/538 主分类号 H01L23/48
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