发明名称 |
HEAT CONDUCTION MEASURING DEVICE AND HEAT CONDUCTION MEASURING METHOD |
摘要 |
A thermal conduction measuring apparatus (10) comprising: an upper rod (23) thermally connected to a heating source; a lower rod (25) thermally connected to a cooling source; a cartridge (24) having a sample block (24a) thermally coupled with the upper rod (23) and a sample block (24b) thermally coupled with the lower rod (25), and sandwichingly holding a sample (W) between the sample blocks (24a, 24b); a temperature sensor (45, 46) adapted to measure respective temperatures of the sample blocks (24a, 24b); a temperature calculation section (66) operable to derive a temperature gradient in the upper rod (23) and a temperature gradient in the lower rod (25) and then derive a temperature difference between the sample blocks (24a, 24b) from the temperatures measured by the temperature sensor (45, 46); and a physical-property-value derivation section (67) operable to derive a thermal conduction-related physical property value of the sample (W) based on a calculation result by the temperature calculation section (66).
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申请公布号 |
EP2418477(A1) |
申请公布日期 |
2012.02.15 |
申请号 |
EP20100750542 |
申请日期 |
2010.03.08 |
申请人 |
JOSHO GAKUEN EDUCATIONAL FOUNDATION;ESPEC CORP. |
发明人 |
OGUSHI, TETSURO;NAKAGAWA, YASUTOSHI;HIRATA, TAKUYA;TANAKA, HIROKAZU |
分类号 |
G01N25/18 |
主分类号 |
G01N25/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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