发明名称 Trench gate laterally diffused MOSFET devices and methods for making such devices
摘要 A MOSFET device for RF applications that uses a trench gate in place of the lateral gate used in lateral MOSFET devices is described. The trench gate in the devices of the invention is provided with a single, short channel for high frequency gain. The device of the invention is also provided with an asymmetric oxide in the trench gate, as well as LDD regions that lower the gate-drain capacitance for improved RF performance. Such features allow these devices to maintain the advantages of the LDMOS structure (better linearity), thereby increasing the RF power gain. The trench gate LDMOS of the invention also reduces the hot carrier effects when compared to regular LDMOS devices by reducing the peak electric field and impact ionization. Thus, the devices of the invention will have a better breakdown capability.
申请公布号 US7033891(B2) 申请公布日期 2006.04.25
申请号 US20020269126 申请日期 2002.10.03
申请人 FAIRCHILD SEMICONDUCTOR CORPORATION 发明人 WILSON PETER H.;SAPP STEVEN;THORNTON NEILL
分类号 H01L21/336;H01L21/8238;H01L29/423;H01L29/76;H01L29/78;H01L29/94;H01L31/062 主分类号 H01L21/336
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