发明名称 POSITIVE RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN
摘要 <p>Disclosed is a positive resist composition containing a base resin component (A) having an acid-cleavable dissolution inhibiting group whose alkali solubility is increased by the action of an acid, and an acid generator component (B) which generates an acid when irradiated with radiation. The component (A) contains a resin having an absorbance of not more than 1.0 (1/mum) at 193 nm and a dispersity (Mw/Mn) of not more than 1.5. This positive resist composition is applicable to thermal flow processes.</p>
申请公布号 KR20070022334(A) 申请公布日期 2007.02.26
申请号 KR20067026667 申请日期 2005.06.14
申请人 发明人
分类号 G03F7/004;G03F7/039;G03F7/40;H01L21/027 主分类号 G03F7/004
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