| 摘要 |
PURPOSE: A semiconductor memory device and an operating method thereof are provided to check a CAM(Content Addressable Memory) cell loading error by checking an error when option information stored at a CAM cell is loaded. CONSTITUTION: Option information and error check information are stored in a CAM block. Power is inputted(S301). A control logic loads data in the CAM block(S303). A control logic performs a CRC(Cyclic Redundancy Checking) by using CRC information about option information(S305). The control logic performs the CRC by using CRC information about a repair column address(S307). The control logic performs the CRC by using CRC information about a bad block address(S309). |
