发明名称 Low-GIDL MOSFET structure and method for fabrication
摘要 A low-GIDL current MOSFET device structure and a method of fabrication thereof which provides a low-GIDL current. The MOSFET device structure contains a central gate conductor whose edges may slightly overlap the source/drain diffusions, and left and right side wing gate conductors which are separated from the central gate conductor by a thin insulating and diffusion barrier layer.
申请公布号 KR100754305(B1) 申请公布日期 2007.09.03
申请号 KR20057010895 申请日期 2005.06.14
申请人 发明人
分类号 H01L21/336;H01L21/265;H01L21/28;H01L29/49;H01L29/78 主分类号 H01L21/336
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