| 摘要 |
The present idea refers to a needle head, its use in a probe arrangement, and a method for electrically contacting multiple electronic components. The needle head (1) comprises a body (11) with a lower surface (111), needle electrodes (12) emerging from the lower surface (111), and multiple outlets (13) arranged in the lower surface (111). A channel (15) is arranged between an inlet (14) in the body and the outlets (13) for conveying a medium from the inlet (14) to the outlets (13). By this means, electronic components arranged in close distance under the lower surface (111) of the needle head (1) are directly exposed to the medium which provides a test environment during a test of the electronic components. |
