TEST PIECE CARRIER FOR TRANSMISSION TYPE ELECTRON MICROSCOPE AND ITS MANUFACTURING METHOD, OBSERVATION AND CRYSTAL STRUCTURE ANALYSIS METHODS USING THE SAME, AND TEST PIECE FOR TRANSMISSION TYPE ELECTRON MICROSCOPE AND ITS MANUFACTURING METHOD

摘要

PROBLEM TO BE SOLVED: To provide a test piece carrier for a transmission type electron microscope and its manufacturing method, a test piece for the transmission type electron microscope and its manufacturing method, as well as observation and crystal structure analysis methods using the test piece for the transmission type electron microscope, wherein observation using the transmission type electron microscope can obtain observation data of an object to be observed in various directions. SOLUTION: A micro-grid 10 comprises a grid body 12, a catalyst layer 14 formed on the edge of the grid body 12, and a carbon nanotube 16 formed on the top surface of the catalyst layer 14. A test piece 20 comprises the micro-grid 10 and an object to be observed (a protein layer 18 for example) which is cladded at the lateral side of the carbon nanotube 16 used as a component of the micro-grid 10. The observation method is carried out in such a manner that the test piece 20 which is set up on a test piece holder is mounted on a transmission type electron microscope. COPYRIGHT: (C)2008,JPO&INPIT