发明名称 System and method for on-chip-variation analysis
摘要 Apparatus is provided for performing timing analysis on a circuit. A first storage device portion stores a state dependent stage weight for each of a rising time arc and a falling time arc of each of a plurality of cells in a cell library. An adder is provided for calculating a sum of the state dependent stage weights for each of the cells that are included in a circuit path. A second storage device portion stores a table containing on chip variation (OCV) derating factors. The table is indexed by values of the sum. A total path delay is calculated for the circuit path, based on the OCV derating factor corresponding to the sum of the state dependent stage weights for the cells in the circuit path.
申请公布号 US8117575(B2) 申请公布日期 2012.02.14
申请号 US20090538507 申请日期 2009.08.10
申请人 LU LEE-CHUNG;WANG CHUNG-HSING;HOU YUAN-TE;TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 LU LEE-CHUNG;WANG CHUNG-HSING;HOU YUAN-TE
分类号 G06F17/50 主分类号 G06F17/50
代理机构 代理人
主权项
地址