发明名称 Semiconductor single crystal growth method having improvement in oxygen concentration characteristics
摘要 The present invention relates to a semiconductor single crystal growth method, which uses a Czochralski process for growing a semiconductor single crystal through a solid-liquid interface by dipping a seed into a semiconductor melt received in a quartz crucible and pulling up the seed while rotating the quartz crucible and applying a strong horizontal magnetic field, wherein the seed is pulled up while the quartz crucible is rotated with a rate between 0.6 rpm and 1.5 rpm.
申请公布号 US8114216(B2) 申请公布日期 2012.02.14
申请号 US20080263000 申请日期 2008.10.31
申请人 CHO HYON-JONG;SHIN SEUNG-HO;MOON JI-HUN;LEE HONG-WOO;HONG YOUNG-HO;SILTRON, INC. 发明人 CHO HYON-JONG;SHIN SEUNG-HO;MOON JI-HUN;LEE HONG-WOO;HONG YOUNG-HO
分类号 C30B15/00 主分类号 C30B15/00
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