发明名称 Silicon dioxide cantilever support and method for silicon etched structures
摘要 An apparatus includes a semiconductor layer (2) having therein a cavity (4). A dielectric layer (3) is formed on the semiconductor layer. A plurality of etchant openings (24) extend through the dielectric layer for passage of etchant for etching the cavity. An SiO2 pillar (25) extends from a bottom of the cavity to engage and support a portion of the dielectric layer extending over the cavity. In one embodiment, a cap layer (34) on the dielectric layer covers the etchant openings.
申请公布号 US8114779(B2) 申请公布日期 2012.02.14
申请号 US201113208130 申请日期 2011.08.11
申请人 MEINEL WALTER B.;LAZAROV KALIN V.;GOODLIN BRIAN E.;TEXAS INSTRUMENTS INCORPORATED 发明人 MEINEL WALTER B.;LAZAROV KALIN V.;GOODLIN BRIAN E.
分类号 H01L21/311 主分类号 H01L21/311
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