发明名称 Pre-treatment method to increase copper island density of CU on barrier layers
摘要 A method for producing on-chip interconnect structures on a substrate is provided, comprising at least the steps of providing a substrate and depositing a ruthenium-comprising layer on top of said substrate, and then performing a pre-treatment of the Ru-comprising layer electrochemically with an HBF4-based electrolyte, and then performing electrochemical deposition of copper onto the pre-treated Ru-comprising layer.
申请公布号 US8114770(B2) 申请公布日期 2012.02.14
申请号 US20100764721 申请日期 2010.04.21
申请人 VEREECKEN PHILIPPE M.;RADISIC ALEKSANDAR;IMEC 发明人 VEREECKEN PHILIPPE M.;RADISIC ALEKSANDAR
分类号 H01L21/4763 主分类号 H01L21/4763
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