| 摘要 |
FIELD: material inspection. ^ SUBSTANCE: invention can be used for measuring surface texture properties and mechanical properties of materials with submicron and nanoscale spatial expansion. The device comprises a piezo-electrical rod with two external electrodes and one separating electrode, an indenter positioned on one of the rod ends, a holder positioned on another rod end, an exciting circuit, and a detector circuit. The device is also fitted with an optic sensor comprising a light source and a light receiver. The piezo-electric rod is positioned between the light source and the light receiver in such a way so it partially obscures the light with the possibility of changing the amount of light falling on the receiver in its curve. ^ EFFECT: surface scan possibility, the rod static bending and the force applied to the indentor during the indentation process can be measured, expanding the device functionality. ^ 4 cl, 3 dwg |
