发明名称 PROCESS CONTROL USING PROCESS DATA AND YIELD DATA
摘要 A method for monitoring a manufacturing tool features acquiring metrology data (“Step a”). Data is acquired for process variables for a first process step performed by the manufacturing tool (“Step b”). A mathematical model of the first process step based on the metrology data and the acquired data is created (“Step c”). Steps b and c are repeated for at least a second process step (“Step d”). An nth mathematical model is created based on the metrology data and the data for the process variables for each of the n process steps (“Step e”). A top level mathematical model is created based on the metrology data and the models created by steps c, d and e (“Step f”). A multivariate metric is calculated based on the top level model of step f and data from subsequent runs of the manufacturing tool. Service is performed if the metric satisfies a condition.
申请公布号 US2012035755(A1) 申请公布日期 2012.02.09
申请号 US201113189280 申请日期 2011.07.22
申请人 BYRNE TAMARA;ERIKSSON LENNART;WOLD SVANTE BJARNE;MKS INSTRUMENTS, INC. 发明人 BYRNE TAMARA;ERIKSSON LENNART;WOLD SVANTE BJARNE
分类号 G05B13/04 主分类号 G05B13/04
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