发明名称 WORD LINE DRIVING CIRCUIT, SEMICONDUCTOR MEMORY DEVICE INCLUDING THE SAME, AND METHOD FOR TESTING THE SEMICONDUCTOR MEMORY DEVICE
摘要 A semiconductor memory device in accordance with the present invention is able to facilitate detecting whether a word line fails or not by floating the word line. The semiconductor memory device includes a word line driver, and a floating controller. The word line driver is configured to control a word line to be enabled/disabled. The floating controller is configured to control the word line driver to float the word line in response to a word line floating signal.
申请公布号 US2012033516(A1) 申请公布日期 2012.02.09
申请号 US201113274722 申请日期 2011.10.17
申请人 DO CHANG-HO 发明人 DO CHANG-HO
分类号 G11C8/08;G11C29/00 主分类号 G11C8/08
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