发明名称 |
SUBSTRATE PROCESSING APPARATUS |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a substrate processing apparatus capable of independently performing density control with little effect by a process liquid because the process liquid density can be directly detected, and accurately performing substrate chemical processing. <P>SOLUTION: A substrate processing apparatus for soaking a substrate in a process liquid composed of chemical and diluted solution for processing comprises: a processing tank 1 for storing the process liquid; heating means 2 and 3 for heating the process liquid; temperature detection means 4 for detecting a process liquid temperature; temperature control means 5 for operating the heating means 2 and 3 so that the process liquid temperature approaches to a set temperature; replenishment means 6 for replenishing the process liquid with the diluted solution; density detection means 7 for detecting a process liquid density by measuring the light absorption characteristics of the process liquid; and density control means 8 for operating the replenishment means 6 so that the process liquid density approaches to a set density. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012028580(A) |
申请公布日期 |
2012.02.09 |
申请号 |
JP20100166288 |
申请日期 |
2010.07.23 |
申请人 |
KURABO IND LTD;CHEM ART TECHNOL:KK |
发明人 |
KIYOSE HIROMI;HIRAKI SATORU;WATABE HIROSHI |
分类号 |
H01L21/306;H01L21/304 |
主分类号 |
H01L21/306 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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