发明名称 DEVICE AND METHOD FOR UNIFORM STI RECESS
摘要 A semiconductor device and method for forming the semiconductor device include forming structures in a semiconductor substrate. The structures have two or more different spacings between them. A dielectric material is deposited in the spacings. Ion species are implanted to a depth in the dielectric material to change an etch rate of the dielectric material down to the depth. The dielectric material having the ion species is etched selective to the dielectric material below the depth such that a substantially uniform depth in the dielectric material is created across the at least two spacings.
申请公布号 US2012032267(A1) 申请公布日期 2012.02.09
申请号 US20100851966 申请日期 2010.08.06
申请人 CHENG KANGGUO;DORIS BRUCE B.;KHAKIFIROOZ ALI;SHAHIDI GHAVAM G.;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CHENG KANGGUO;DORIS BRUCE B.;KHAKIFIROOZ ALI;SHAHIDI GHAVAM G.
分类号 H01L29/06;H01L21/302 主分类号 H01L29/06
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