发明名称 Semiconductor Devices Having A Diffusion Barrier Layer and Methods of Manufacturing the Same
摘要 Methods of manufacturing a semiconductor device include forming a gate insulation layer including a high-k dielectric material on a substrate that is divided into a first region and a second region; forming a diffusion barrier layer including a first metal on a second portion of the gate insulation layer in the second region; forming a diffusion layer on the gate insulation layer and the diffusion barrier layer; and diffusing an element of the diffusion layer into a first portion of the gate insulation layer in the first region.
申请公布号 US2012032332(A1) 申请公布日期 2012.02.09
申请号 US201113191948 申请日期 2011.07.27
申请人 LIM HA JIN;DO JIN-HO;KIM WEON-HONG;SONG MOON-KYUN;JOO DAE-KWON 发明人 LIM HA JIN;DO JIN-HO;KIM WEON-HONG;SONG MOON-KYUN;JOO DAE-KWON
分类号 H01L29/49;H01L21/28 主分类号 H01L29/49
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