发明名称 SPECIMEN ANALYSIS SYSTEM, SPECIMEN ANALYZER, MANAGEMENT DEVICE, AND METHOD FOR MANAGING SPECIMEN ANALYZER
摘要 <P>PROBLEM TO BE SOLVED: To provide a specimen analysis system by which a prompt and exact maintenance work of a specimen analyzer is possible, the specimen analyzer, a management device, and a method for managing the specimen analyzer. <P>SOLUTION: The specimen analyzer 2 transmits report data for reporting an operational state of the specimen analyzer in activation of the specimen analyzer 2, the start of calibrator measurement, the end of the calibrator measurement, validation of an analytical curve, the start of measurement of a specimen, the end of the measurement of the specimen, and shutdown of the specimen analyzer 2. A management server 7 for maintenance of the specimen analyzer 2 outputs notification information for notifying an operator that the specimen analyzer 2 operates when the report data is received. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012026947(A) 申请公布日期 2012.02.09
申请号 JP20100167725 申请日期 2010.07.27
申请人 SYSMEX CORP 发明人 SHINDO NAOKI;SONE ATSUMASA;KISHIDA TAIZO;HIRATA TSUKASA
分类号 G01N35/00 主分类号 G01N35/00
代理机构 代理人
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