发明名称 POLISHING COMPOUND AND METHOD OF MANUFACTURING SILICON WAFER
摘要 <P>PROBLEM TO BE SOLVED: To provide a polishing compound which reduces contamination of a wafer due to metal impurities effectively. <P>SOLUTION: The polishing compound and a composition for rinse reduce contamination of a wafer due to metal impurities effectively. The polishing compound contains a chelate agent, an alkali compound, silicon dioxide and water. The composition for rinse contains a chelate agent, an alkali compound and water. The chelate agent contained in the polishing compound and the composition for rinse has a higher ability of capturing at least one kind of element selected from nickel and copper than ethylene diamine tetraacetic acid. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012028796(A) 申请公布日期 2012.02.09
申请号 JP20110198439 申请日期 2011.09.12
申请人 FUJIMI INC;WAKO PURE CHEM IND LTD 发明人 KAWASE AKIHIRO;MIWA TOSHIHIRO;SAKAMOTO KENJI;HAYASHIDA KAZUYOSHI
分类号 H01L21/304;B24B37/00;C09G1/02;C09K3/14;C11D7/20;C11D7/36;C11D11/00;H01L21/02;H01L21/306 主分类号 H01L21/304
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