发明名称 |
POLISHING COMPOUND AND METHOD OF MANUFACTURING SILICON WAFER |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a polishing compound which reduces contamination of a wafer due to metal impurities effectively. <P>SOLUTION: The polishing compound and a composition for rinse reduce contamination of a wafer due to metal impurities effectively. The polishing compound contains a chelate agent, an alkali compound, silicon dioxide and water. The composition for rinse contains a chelate agent, an alkali compound and water. The chelate agent contained in the polishing compound and the composition for rinse has a higher ability of capturing at least one kind of element selected from nickel and copper than ethylene diamine tetraacetic acid. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012028796(A) |
申请公布日期 |
2012.02.09 |
申请号 |
JP20110198439 |
申请日期 |
2011.09.12 |
申请人 |
FUJIMI INC;WAKO PURE CHEM IND LTD |
发明人 |
KAWASE AKIHIRO;MIWA TOSHIHIRO;SAKAMOTO KENJI;HAYASHIDA KAZUYOSHI |
分类号 |
H01L21/304;B24B37/00;C09G1/02;C09K3/14;C11D7/20;C11D7/36;C11D11/00;H01L21/02;H01L21/306 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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