| 摘要 |
PURPOSE: A semiconductor memory device and an operating method thereof are provided to perform a test operation by receiving an address signal of the minimum number of bits in a test mode. CONSTITUTION: An address buffering unit(310) buffers a bank address signal and a cell address signal and outputs the buffered signals. A clock buffering unit(320) outputs an internal clock signal. A first address latching unit(330) latches an output signal of the address buffering unit. A second address latching unit(340) latches an output signal of the address selection output unit. A plurality of address shifting units successively receive an address signal and shift the address signal. A plurality of address selection output units(350) output the address signal to the plurality of address shifting units. The plurality of address selection output units outputs the output signal of a prior address shifting unit to a following address shifting unit in a test mode. |
